DocumentCode
1560438
Title
Catastrophic latchup in CMOS analog-to-digital converters
Author
Miyahira, T.F. ; Johnston, A.H. ; Becker, H.N. ; LaLumondiere, S.D. ; Moss, S.C.
Author_Institution
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Volume
48
Issue
6
fYear
2001
fDate
12/1/2001 12:00:00 AM
Firstpage
1833
Lastpage
1840
Abstract
Heavy-ion latchup is investigated for analog-to-digital converters. Differences in cross section for various ions show that charge is collected at depths beyond 50 μm, causing the cross section to be underestimated unless long-range ions are used. Current distributions, thermal imaging, and diagnostic tests with a pulsed laser were used to identify latchup-sensitive regions. Latchup in one of the circuit types was catastrophic, even when the power was turned off within 2 ms of a latchup event. Examination of damaged devices with a scanning electron microscope showed that the failures occurred in metallization and contact regions. Current density for failure agrees with pulsed current metallization stress data in the literature
Keywords
CMOS digital integrated circuits; analogue-digital conversion; current density; failure analysis; integrated circuit metallisation; integrated circuit reliability; integrated circuit testing; ion beam effects; radiation hardening (electronics); scanning electron microscopy; 2 ms; 50 micron; CMOS analog-to-digital converters; catastrophic latchup; contact regions; cross section; current density; current distributions; damaged devices; diagnostic tests; failures; heavy-ion latchup; latchup-sensitive regions; long-range ions; metallization; pulsed current metallization stress data; pulsed laser; scanning electron microscopy; thermal imaging; Analog-digital conversion; Circuits; Current distribution; Laboratories; Metallization; NASA; Power supplies; Propulsion; Space technology; Substrates;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/23.983139
Filename
983139
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