Title :
Analog and digital single-event effects experiments in space
Author :
Crain, S.H. ; Mazur, J.E. ; Katz, R.B. ; Koga, R. ; Looper, M.D. ; Lorentzen, K.R.
Author_Institution :
Aerosp. Corp., El Segundo, CA, USA
fDate :
12/1/2001 12:00:00 AM
Abstract :
Field-programmable gate arrays (FPGAs) and operational amplifiers are commonly used microelectronics in spaceflight instrumentation. In ground-based testing, these devices have been shown to experience single-event upset (SEU), the digital variety for the FPGA and the analog or transient type for the op-amps. Two experiment boards on the Microelectronics and Photonics Test Bed (MPTB) test these same parts in space. The data collected to date are presented here. The most interesting results are not from the primary focus of the SEU but from the total ionizing dose (TID) current monitoring of the FPGAs
Keywords :
field programmable gate arrays; integrated circuit testing; ion beam effects; operational amplifiers; proton effects; space vehicle electronics; COTS; FPGA; MPTB test; SEE; SET; SEU; analog single-event effects experiments; digital single-event effects experiments; field-programmable gate arrays; heavy ion radiation; microelectronics; microelectronics/photonics test bed; operational amplifiers; proton irradiation; radiation effects; single-event transient; single-event upset; space environment; spaceflight instrumentation; total ionizing dose current monitoring; Circuits; Field programmable gate arrays; Microelectronics; Operational amplifiers; Photonics; Rails; Single event upset; Space technology; Testing; Voltage;
Journal_Title :
Nuclear Science, IEEE Transactions on
