Title :
Design considerations and verification testing of an SEE-hardened quad comparator
Author :
van Onno, N.W. ; Doyle, Brent R.
Author_Institution :
Intersil Corp., Melbourne, FL, USA
fDate :
12/1/2001 12:00:00 AM
Abstract :
Describes design considerations and single-event effect (SEE) testing results of a hardened quad comparator equivalent to the industry standard "139" device. The hardened part uses redundancy and hardened complementary BiCMOS processing to achieve improved SEE performance
Keywords :
BiCMOS analogue integrated circuits; comparators (circuits); integrated circuit design; integrated circuit testing; radiation hardening (electronics); redundancy; SEE performance; SEE-hardened quad comparator; analog comparator; analog integrated circuit; design considerations; hardened complementary BiCMOS processing; radiation effects; redundancy; verification testing; Analog integrated circuits; BiCMOS integrated circuits; Circuit testing; Fabrication; Helium; Integrated circuit testing; Radiation effects; Radiation hardening; Redundancy; Voting;
Journal_Title :
Nuclear Science, IEEE Transactions on
