DocumentCode :
1560446
Title :
The use of proton testing for evaluating COTS: example of a commercial camera for ISS
Author :
Lum, Gary K. ; Robinette, L. ; Howard, A.
Author_Institution :
Lockheed Martin Space Syst. Co., Sunnyvale, CA, USA
Volume :
48
Issue :
6
fYear :
2001
fDate :
12/1/2001 12:00:00 AM
Firstpage :
1885
Lastpage :
1892
Abstract :
With the increasing demand for high performance and lower cost, commercial off-the-shelf (COTS) parts are being applied to many space applications. Because certain products have a large quantity of COTS devices, testing them individually can become cost prohibitive and complex. Proton testing provides such a compromise. Depending on the space environment and the application, proton testing can be a cost effective technique for evaluating parts. This paper presents some of the advantages and disadvantages in considering tradeoffs between protons versus heavy ion testing. Such a case is discussed of using a commercial video controller and CCD for a LEO system such as the International Space Station where COTS are heavily being considered. Possible risk mitigating steps are suggested to reduce the possibility of a catastrophic failure
Keywords :
CCD image sensors; aerospace testing; integrated circuit testing; proton effects; radiation hardening (electronics); semiconductor device testing; space vehicle electronics; video cameras; CCD image sensor; COTS devices; COTS evaluation; IC radiation effects; ISS; International Space Station; LEO system; aerospace testing; charge coupled devices; commercial camera; commercial off-the-shelf parts; integrated circuit radiation effects; proton radiation effects; proton testing; radiation hardening; semiconductor radiation effects; space applications; video controller; Aerospace testing; Cameras; Charge-coupled image sensors; Costs; Global Positioning System; Low earth orbit satellites; Navigation; Protons; Radiation effects; Space technology;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.983147
Filename :
983147
Link To Document :
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