• DocumentCode
    1560446
  • Title

    The use of proton testing for evaluating COTS: example of a commercial camera for ISS

  • Author

    Lum, Gary K. ; Robinette, L. ; Howard, A.

  • Author_Institution
    Lockheed Martin Space Syst. Co., Sunnyvale, CA, USA
  • Volume
    48
  • Issue
    6
  • fYear
    2001
  • fDate
    12/1/2001 12:00:00 AM
  • Firstpage
    1885
  • Lastpage
    1892
  • Abstract
    With the increasing demand for high performance and lower cost, commercial off-the-shelf (COTS) parts are being applied to many space applications. Because certain products have a large quantity of COTS devices, testing them individually can become cost prohibitive and complex. Proton testing provides such a compromise. Depending on the space environment and the application, proton testing can be a cost effective technique for evaluating parts. This paper presents some of the advantages and disadvantages in considering tradeoffs between protons versus heavy ion testing. Such a case is discussed of using a commercial video controller and CCD for a LEO system such as the International Space Station where COTS are heavily being considered. Possible risk mitigating steps are suggested to reduce the possibility of a catastrophic failure
  • Keywords
    CCD image sensors; aerospace testing; integrated circuit testing; proton effects; radiation hardening (electronics); semiconductor device testing; space vehicle electronics; video cameras; CCD image sensor; COTS devices; COTS evaluation; IC radiation effects; ISS; International Space Station; LEO system; aerospace testing; charge coupled devices; commercial camera; commercial off-the-shelf parts; integrated circuit radiation effects; proton radiation effects; proton testing; radiation hardening; semiconductor radiation effects; space applications; video controller; Aerospace testing; Cameras; Charge-coupled image sensors; Costs; Global Positioning System; Low earth orbit satellites; Navigation; Protons; Radiation effects; Space technology;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.983147
  • Filename
    983147