Title :
Critical charge for single-event transients (SETs) in bipolar linear circuits
Author :
Pease, Ronald L. ; Sternberg, Andrew ; Massengill, Lloyd ; Schrimpf, Ron ; Buchner, Stephen ; Savage, Mark ; Titus, Jeff ; Turflinger, Tom
Author_Institution :
RLP Res. Inc, Albuquerque, NM, USA
fDate :
12/1/2001 12:00:00 AM
Abstract :
The critical charge for single-event transients (SETS) from heavy ions has been simulated and measured in bipolar linear circuits under several bias conditions. Although in many cases the threshold linear energy transfer is less than 2 MeV-cm2/mg, the minimum critical charge is of the order of 0.3-1 pC
Keywords :
SPICE; bipolar analogue integrated circuits; circuit simulation; integrated circuit modelling; integrated circuit reliability; integrated circuit testing; ion beam effects; operational amplifiers; SETs; SPICE simulation; bias conditions; bipolar linear circuits; critical charge; heavy ion testing; heavy ions; ion microbeam; minimum critical charge; operational amplifiers; single-event transients; threshold linear energy transfer; Circuit simulation; Circuit testing; Cranes; Energy exchange; Energy measurement; Linear circuits; Operational amplifiers; Protons; SPICE; Voltage;
Journal_Title :
Nuclear Science, IEEE Transactions on
