• DocumentCode
    1560457
  • Title

    Critical charge for single-event transients (SETs) in bipolar linear circuits

  • Author

    Pease, Ronald L. ; Sternberg, Andrew ; Massengill, Lloyd ; Schrimpf, Ron ; Buchner, Stephen ; Savage, Mark ; Titus, Jeff ; Turflinger, Tom

  • Author_Institution
    RLP Res. Inc, Albuquerque, NM, USA
  • Volume
    48
  • Issue
    6
  • fYear
    2001
  • fDate
    12/1/2001 12:00:00 AM
  • Firstpage
    1966
  • Lastpage
    1972
  • Abstract
    The critical charge for single-event transients (SETS) from heavy ions has been simulated and measured in bipolar linear circuits under several bias conditions. Although in many cases the threshold linear energy transfer is less than 2 MeV-cm2/mg, the minimum critical charge is of the order of 0.3-1 pC
  • Keywords
    SPICE; bipolar analogue integrated circuits; circuit simulation; integrated circuit modelling; integrated circuit reliability; integrated circuit testing; ion beam effects; operational amplifiers; SETs; SPICE simulation; bias conditions; bipolar linear circuits; critical charge; heavy ion testing; heavy ions; ion microbeam; minimum critical charge; operational amplifiers; single-event transients; threshold linear energy transfer; Circuit simulation; Circuit testing; Cranes; Energy exchange; Energy measurement; Linear circuits; Operational amplifiers; Protons; SPICE; Voltage;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.983158
  • Filename
    983158
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1560457