• DocumentCode
    1560467
  • Title

    Displacement damage in silicon due to secondary neutrons, pions, deuterons, and alphas from proton interactions with materials

  • Author

    Jun, Insoo ; McAlpine, William

  • Author_Institution
    Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
  • Volume
    48
  • Issue
    6
  • fYear
    2001
  • fDate
    12/1/2001 12:00:00 AM
  • Firstpage
    2034
  • Lastpage
    2038
  • Abstract
    The enhancement of displacement damage energy deposition due to secondary neutrons, pions, deuterons, and alphas resulting from high-energy (100-1000 MeV) proton interactions with aluminum and tungsten shielding are examined in this paper. The results obtained using a comprehensive Monte Carlo charged particle transport code, MCNPX Version 2.1.5, indicated that the dominant secondary particle is neutrons. The additional contribution to the displacement damage energy produced by secondary pions, deuterons, and alphas turned out to be less than 5%
  • Keywords
    Monte Carlo methods; alpha-particle effects; aluminium; deuteron effects; elemental semiconductors; neutron effects; proton effects; radiation hardening (electronics); silicon; tungsten; 100 to 1000 MeV; Al; Monte Carlo charged particle transport code; Si; W; alphas; aluminum; deuterons; displacement damage; displacement damage energy; energy deposition; pions; proton interactions; secondary neutrons; secondary particle; silicon; tungsten shielding; Aluminum; Energy loss; Laboratories; Mesons; Monte Carlo methods; Neutrons; Propulsion; Protons; Silicon; Tungsten;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.983168
  • Filename
    983168