Title :
Next generation UltraFlex (NGU) technology maturation for NASA´s New Millennium Program (NMP) Space Technology 8 (ST8)
Author :
Spence, Brian ; White, Steve ; Wilder, Nick ; Gregory, Todd ; Douglas, Mark ; Takeda, Ron ; Mardesich, Nick ; Peterson, Todd ; Hillard, Barry ; Sharps, Paul ; Fatermi, N.
Author_Institution :
AEC-ABLE Eng., USA
Abstract :
ABLE Engineering, Inc. (ABLE), in collaboration with the NASA Glenn Research Center (GRC), Jet Propulsion Laboratory (JPL), and EMCORE Photovoltaics (EPV), has been selected for the NASA New Millennium Program (NMP) Space Technology 8 (ST8) Study Phase project to develop and potentially flight validate a state-of-the-art solar array system called: "next generation UltraFlex" NGU is a highly evolved and scaled version of the previously flight qualified Mars 01-Lander UltraFlex and employs many advanced technologies. The NGU system promises very high specific power (175 W/g - 220 W/kg BOL), compact storage volume (>33 kW/m3), high reliability, scalability beyond 7 kW wing sizes, and operational capability for standard, high voltage, multi-A.U., and/or high temperature applications. Key technology maturation activities performed (deployment kinematics, deployed dynamics, and power production/survivability) that demonstrate TRL 4+ achievement will be presented. NGU design, development, analysis, and hardware activities are presented. NGU subsystem and system level experimental tests/results and model correlation will be presented. NGU technology scale-up performance to 7 kW wing sizes will also be addressed.
Keywords :
aerospace instrumentation; solar cell arrays; 7 kW; Mars 01-Lander UltraFlex; New Millennium Program Space Technology 8; compact storage volume; deployed dynamics; deployment kinematics; next generation UltraFlex; power production; survivability; Aerospace engineering; Collaboration; Laboratories; Mars; NASA; Phased arrays; Photovoltaic cells; Power system reliability; Propulsion; Space technology;
Conference_Titel :
Photovoltaic Specialists Conference, 2005. Conference Record of the Thirty-first IEEE
Print_ISBN :
0-7803-8707-4
DOI :
10.1109/PVSC.2005.1488260