• DocumentCode
    1560948
  • Title

    Silicon oxide/silicon nitride stack system for 20% efficient silicon solar cells

  • Author

    Schultz, O. ; Hofmann, M. ; Glunz, S.W. ; Willeke, G.P.

  • Author_Institution
    Fraunhofer-Inst. fur Solare Energiesysteme, Freiburg, Germany
  • fYear
    2005
  • Firstpage
    872
  • Lastpage
    876
  • Abstract
    Thick thermal oxides of more than 100 nm are commonly used for the production of high-efficiency silicon solar cells from mono- and multicrystalline silicon and have led to the highest conversion efficiencies reported so far. This superior performance of oxides is due to the very good surface passivation by the reduction of the density of interface states. The process to achieve such thick oxides are usually performed at high temperatures for a long time. In this paper we investigate different rear stack systems of a thin thermally grown silicon oxide and PECVD silicon nitride and PECVD silicon oxide layers for rear surface passivation. In a comparatively easy high-efficiency process with laser fired rear contacts (LFC) efficiencies above 20% for FZ-Si and 18.2% for multicrystalline silicon were achieved.
  • Keywords
    electronic density of states; elemental semiconductors; interface states; passivation; plasma CVD; reflectivity; silicon; silicon compounds; solar cells; thermal stability; PECVD silicon nitride layers; PECVD silicon oxide layers; Si; SiO2-SiN; conversion efficiencies; density of interface states; laser fired rear contacts; silicon oxide-silicon nitride stack system; silicon solar cells; surface passivation; thermal oxides; thin thermally grown silicon oxide; Aluminum; Interface states; Oxidation; Passivation; Photovoltaic cells; Production systems; Reflectivity; Silicon; Solar energy; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2005. Conference Record of the Thirty-first IEEE
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-8707-4
  • Type

    conf

  • DOI
    10.1109/PVSC.2005.1488271
  • Filename
    1488271