Title :
Self-consistent determination of the generation rate in photoluminescence and photoconductance lifetime measurements
Author :
Bardos, R.A. ; Trupke, T.
Author_Institution :
Centre of Excellence for Adv. Silicon Photovoltaics & Photonics, New South Wales Univ., Sydney, NSW, Australia
Abstract :
Our recently described self-consistent method for calibrating the generation rate in photoconductance (PC) effective-lifetime measurements is extended to photoluminescence (PL) effective-lifetime measurements. The purpose of the method is to eliminate the need to separately measure the generation rate using the spectral absorptance of the sample and the measured absolute light intensity. This new method is expected to increase the accuracy of effective-lifetime measurements, especially in cases such as textured or thin samples, when the spectral absorptance of the sample and the reference cell used to measure the light intensity are different.
Keywords :
carrier lifetime; elemental semiconductors; photoconductivity; photoluminescence; silicon; Si; effective-lifetime measurements; generation rate; photoconductance lifetime; photoluminescence; self-consistent method; spectral absorptance; Australia; Facsimile; Light emitting diodes; Photoconductivity; Photoluminescence; Photonics; Photovoltaic cells; Silicon; Steady-state; Telephony;
Conference_Titel :
Photovoltaic Specialists Conference, 2005. Conference Record of the Thirty-first IEEE
Print_ISBN :
0-7803-8707-4
DOI :
10.1109/PVSC.2005.1488276
