DocumentCode
1561471
Title
A modified model for large grain multicrystalline silicon used for solar cells
Author
Wang, He ; Yang, Hong ; Wu, Hongcai ; Wu, Guoming
Author_Institution
Dept. of Phys., Xi´´an Jiaotong Univ., China
fYear
2005
Firstpage
1141
Lastpage
1144
Abstract
The large grain multicrystalline silicon for large scale terrestrial solar cells application has been well recognized, it shares with single crystal silicon numerous desirable physical and chemical properties such as abundance, low toxicity and stability, but the electrical behavior of multicrystalline silicon is different slightly than single crystal silicon. The electrical behavior of multicrystalline silicon is shown to be influenced by the properties of the grain boundaries, the study of the grain boundaries is very important for improving the efficiency of multicrystalline silicon solar cells. Hence, modeling the electrical properties of large grain multicrystalline silicon and their dependence on dopant concentration becomes very important for the proper design of solar cells and good understanding of multicrystalline silicon solar cells under illumination. In this paper, a new phenomenological model based on a combination of dopant segregation, carrier trapping and carrier reflection at grain boundaries for large grain multicrystalline silicon used for solar cells is developed, the grain boundaries are modeled by high-order cosine barriers. The model of the high-order cosine barriers is found to more accurately model the practical silicon grains in the body. The result shows that, as the grain size is increased, the resistivity approaches that of single crystalline silicon, although it always remains slightly higher at the same dopant concentration; and as the dopant concentration is increased, the resistivity approaches that of single crystalline silicon, although it always remains higher at the same grain size.
Keywords
electrical resistivity; electron traps; elemental semiconductors; grain boundaries; hole traps; impurity distribution; semiconductor doping; semiconductor process modelling; silicon; solar cells; Si; carrier reflection; carrier trapping; dopant concentration; dopant segregation; grain boundaries; grain size; high-order cosine barriers; multicrystalline silicon; resistivity; stability; terrestrial solar cells; toxicity; Conductivity; Crystallization; Grain boundaries; Grain size; Large-scale systems; Photovoltaic cells; Semiconductor process modeling; Silicon; Stability; Toxic chemicals;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 2005. Conference Record of the Thirty-first IEEE
ISSN
0160-8371
Print_ISBN
0-7803-8707-4
Type
conf
DOI
10.1109/PVSC.2005.1488339
Filename
1488339
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