DocumentCode :
1561565
Title :
Drop reliability performance assessment for PCB assemblies of chip scale packages (CSP)
Author :
Chong, Desmond Y R ; Toh, H.J. ; Lim, B.K. ; Low, Patrick T H ; Pang, John H.L. ; Che, F.X. ; Xiong, B.S. ; Xu, Luhua
Author_Institution :
United Test & Assembly Center Ltd., Singapore
Volume :
1
fYear :
2005
Abstract :
Drop impact reliability assessment of solder joints on the chip scale packages is critical for use in miniature handheld products. Replacement of lead-based with lead-free solders requires the need of evaluating its compatibility with existing printed circuit board surface finishes. A 15 times 15mm fine-pitch BGA with solder ball compositions of 36Pb-62Sn-2Ag and Sn-4Ag-0.5Cu on surface finishes of organic solderability preservative, electroless nickel immersion gold and immersion tin were tested. The results revealed a strong influence of different intermetallic compound formation on soldered assemblies drop durability. The lead-based solder supersedes the lead-free composition regardless of the types of surface finish. Joints on organic solderability preservative were found to be strongest for each solder type. Other factors affecting drop reliability such as component location on the board and drop orientation are reported
Keywords :
chip scale packaging; copper alloys; lead alloys; printed circuit testing; reliability; silver alloys; solders; tin alloys; 15 mm; CSP; PCB assembly; PbSnAg; SnAgCu; chip scale packages; drop durability; drop orientation; drop reliability performance assessment; electroless immersion; intermetallic compound formation; lead-free solders; miniature handheld products; organic solderability preservative; solder ball compositions; solder joints; soldered assemblies; Assembly; Chip scale packaging; Environmentally friendly manufacturing techniques; Gold; Lead; Nickel; Printed circuits; Soldering; Surface finishing; Tin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology Conference, 2005. EPTC 2005. Proceedings of 7th
Conference_Location :
Singapore
Print_ISBN :
0-7803-9578-6
Type :
conf
DOI :
10.1109/EPTC.2005.1614404
Filename :
1614404
Link To Document :
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