DocumentCode
1561584
Title
Investigating the cyclic bending of PCB subassembly during board level drop test
Author
Pek, Eric ; Lim, Chwee Teck ; Tee, Tong Yan ; Luan, Jing-En ; Tan, Vincent B C
Author_Institution
Dept. of Mater. Eng., Nat. Univ. of Singapore
Volume
1
fYear
2005
Abstract
The dynamic responses of printed circuit boards (PCBs) mounted with thin-profile fine-pitch BGA (TFBGA) packages under board level drop tests were investigated. Data captured during the tests include accelerations, in-plane strains and in-situ change in solder joint resistance. PCBs were mounted on the drop table using either 4-screw or 6-screw supports. A high-speed charge-coupled device (CCD) camera was used to capture the drop impact process. The PCB bending modes, frequency, velocities before and after impact, impact duration, and deflection were derived from the high-speed photographs. The results are consistent with the measured strain and acceleration. In-situ solder joint resistance is monitored using an oscilloscope. In-situ resistance measurement is important as a solder joint crack may close up again after the impact. For the 4- and 6-screw supports, the in-plane strains are found to be similar, but the flexural frequency and failure rate of the solder joints are different. This is attributed to the bending of the PCB that resulted in solder joint failure
Keywords
ball grid arrays; bending; fine-pitch technology; life testing; printed circuit testing; solders; CCD camera; PCB bending; PCB subassembly; board level drop test; cyclic bending; drop impact test; high-speed charge-coupled device camera; printed circuit boards; resistance measurement; solder joint crack; solder joint failure; solder joint resistance; thin-profile fine-pitch BGA; Capacitive sensors; Charge coupled devices; Circuit testing; Electrical resistance measurement; Frequency; Life estimation; Packaging; Printed circuits; Soldering; Strain measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology Conference, 2005. EPTC 2005. Proceedings of 7th
Conference_Location
Singapore
Print_ISBN
0-7803-9578-6
Type
conf
DOI
10.1109/EPTC.2005.1614406
Filename
1614406
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