• DocumentCode
    1561593
  • Title

    Manifold use of growth substrate in the porous silicon-layer transfer-process

  • Author

    Horbelt, Renate ; Terheiden, Barbara ; Auer, Richard ; Brendel, Rolf

  • Author_Institution
    Institut fur Solarenergieforschung Hameln, Emmerthal, Germany
  • fYear
    2005
  • Firstpage
    1193
  • Lastpage
    1196
  • Abstract
    The number of process cycles that the same monocrystalline Si growth substrate wafer can be used is an important issue when applying layer transfer processes to photovoltaics. Together with the thickness of the epitaxial layer this number controls the Si consumption. The nine-fold application of the porous silicon (PSI) process to the same 4" silicon wafer is demonstrated. The electronic quality of the epitaxial layer is maintained. During this nine-fold use the average consumption of Si from the substrate wafer is 46 μm per cycle. With an improved processing sequence the Si consumption per cycle is reduced to only 12 μm.
  • Keywords
    elemental semiconductors; porous semiconductors; semiconductor epitaxial layers; semiconductor growth; silicon; Si; epitaxial layer; growth substrate; layer transfer-process; photovoltaics; porous silicon; silicon wafer; Chemical vapor deposition; Crystallization; Epitaxial growth; Epitaxial layers; Etching; Glass; Inductors; Photovoltaic cells; Silicon; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2005. Conference Record of the Thirty-first IEEE
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-8707-4
  • Type

    conf

  • DOI
    10.1109/PVSC.2005.1488352
  • Filename
    1488352