• DocumentCode
    1561698
  • Title

    Void of leaded and lead-free solder paste on different PCB surface pad finish under various reflow conditions - further investigation on void of SnInAgBi lead-free soldering paste

  • Author

    Wang, Xiaobai

  • Author_Institution
    Kester Components Pte Ltd., Singapore
  • Volume
    1
  • fYear
    2005
  • Abstract
    Elimination of lead in electronic industry has become a reality and is expected to be universal in the next 1-2 years. SnAgCu series of alloy has been widely accepted as the recommended lead-free alloy in consumer electronics. However, due to its high reflow peak, which may destroy the sensitive components, various kinds of alloys are also introduced to the market. Our previous studies on Sn88In8Ag3.5Bi0.5 (SInAB) alloy has show the possibility of implementing this alloy into solder paste, which provides good solderability and reliability. In this report, further investigation on void of this paste in different reflow atmosphere (Air, N2, vapor) has been carried out. Under different reflow conditions, a comparison between SAC and SInAB pastes has been done. The eutectic Sn63Pb37(SnPb) solder paste was included as the baseline. The results show that under certain reflow condition, paste contains SInAB alloy can achieve better void, which compatible to that of the paste contains SnPb alloy. Several main factors, which cause void are discussed and explained as well
  • Keywords
    bismuth alloys; indium alloys; printed circuit manufacture; reflow soldering; reliability; silver alloys; solders; tin alloys; voids (solid); PCB surface pad finish; SnInAgBi; SnPb; consumer electronics; electronic industry; lead-free solder paste; leaded solder paste; reflow soldering; voids; Assembly; Atherosclerosis; Consumer electronics; Environmentally friendly manufacturing techniques; Lead; Soldering; Surface finishing; Temperature sensors; Testing; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology Conference, 2005. EPTC 2005. Proceedings of 7th
  • Conference_Location
    Singapore
  • Print_ISBN
    0-7803-9578-6
  • Type

    conf

  • DOI
    10.1109/EPTC.2005.1614419
  • Filename
    1614419