Title :
Double layer anti-reflective coatings for silicon solar cells
Author :
Wright, Daniel N. ; Marstein, Erik S. ; Holt, Awe
Author_Institution :
Sect. for Renewable Energy, Inst. for Energiteknikk, Kjeller, Norway
Abstract :
In this paper simulated single and double layer anti-reflective coatings based on the refractive index limits of silicon nitride (SiN) and silicon oxide (SiO2) are presented. The best structure combines SiN and SiO2, resulting in a reflectance of 0.044 based on the AM1.5 photon flux from 300-1150 nm. PC1D solar cell simulations show that an increase in short circuit current density of 6.4% was possible by replacing an optimised single SiN layer with the above mentioned double layer.
Keywords :
antireflection coatings; current density; elemental semiconductors; reflectivity; refractive index; silicon; silicon compounds; solar cells; 300 to 1150 nm; PC1D solar cell simulations; Si; SiN; SiO2; double layer anti-reflective coatings; photon flux; reflectance; refractive index; short circuit current density; silicon nitride; silicon oxide; silicon solar cells; Chemicals; Circuit simulation; Coatings; Optical reflection; Photovoltaic cells; Reflectivity; Refractive index; Short circuit currents; Silicon compounds; Surface waves;
Conference_Titel :
Photovoltaic Specialists Conference, 2005. Conference Record of the Thirty-first IEEE
Print_ISBN :
0-7803-8707-4
DOI :
10.1109/PVSC.2005.1488363