DocumentCode :
1561877
Title :
Investigation of IMC layer effect on PBGA solder joint thermal fatigue reliability
Author :
Che, Fa-Xing ; Pang, John H L ; Xu, Lu-Hua
Author_Institution :
Sch. of Mech. & Aerosp. Eng., Nanyang Technol. Univ., Singapore
Volume :
2
fYear :
2005
Abstract :
Thermal cycling reliability test and analysis for PBGA with Sn-3.8Ag-0.7Cu lead free solder joints with Ni/Au surface finish were investigated. Failure mode of PBGA component exhibits solders fatigue failure with failure site close to solder/IMC interface. The MTTF was determined by Weibull model and used to calibrate the finite element analysis (FEA) results. Intermetallic compound (IMC) layers of CuNiSn are formed when SnAgCu solder is reflowed on PCB board with Ni/Au finish. The reliability of electronic assembly is affected by IMC during thermal cycling. In this paper, finite element analysis of solder joint reliability has been developed to model the effect of IMC layer on solder joint fatigue behavior. It is shown that the IMC layer reduces the solder joint fatigue life. In this study, the elastic modulus for CuNiSn IMC was measured by nanoindentation using a continuous stiffness measurement technique. The IMC elastic modulus effect on solder fatigue was also investigated by FEA modeling
Keywords :
copper alloys; finite element analysis; nickel compounds; reliability; silver alloys; solders; thermal stress cracking; tin alloys; CuNiSn; IMC layer; Ni-Au; PBGA component; PBGA solder joint; PCB boards; SnAgCu; Weibull model; elastic modulus; electronic assembly reliability; failure mode; finite element analysis; intermetallic compound; lead free solder joints; solder-IMC interface; solders fatigue failure; thermal fatigue reliability; Assembly; Environmentally friendly manufacturing techniques; Fatigue; Finite element methods; Gold; Intermetallic; Lead; Soldering; Surface finishing; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology Conference, 2005. EPTC 2005. Proceedings of 7th
Conference_Location :
Singapore
Print_ISBN :
0-7803-9578-6
Type :
conf
DOI :
10.1109/EPTC.2005.1614442
Filename :
1614442
Link To Document :
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