• DocumentCode
    1561914
  • Title

    Straighforward in-line processing for a 16.8% efficient mc-Si solar cell

  • Author

    Tool, C.J.J. ; Coletti, G. ; Granek, F.J. ; Hoornstra, J. ; Koppes, M. ; Kossen, E.J. ; Rieffe, H.C. ; Romjin, I.G. ; Weeber, A.W.

  • Author_Institution
    ECN Solar Energy, Petten, Netherlands
  • fYear
    2005
  • Firstpage
    1324
  • Lastpage
    1327
  • Abstract
    A simple in-line industrial process has been developed for commercial multicrystalline silicon (mc-Si) which results in solar cells with an average efficiency of 16.5%. The best cell has an efficiency of 16.8%. These are the highest efficiencies reported for full inline processing. The process consists of an acidic etch for texturing, homogeneous spin-on phosphorous and a belt furnace emitter diffusion, MicroWave PECVD for silicon nitride layers, and screen-printed metallization. The silicon nitride layer serves as antireflection coating and provides bulk and surface passivation. Detailed characterization and computer simulation showed that implementation of already proven technologies in the current cell processing could lead to efficiencies close to 18%.
  • Keywords
    antireflection coatings; diffusion; elemental semiconductors; etching; firing (materials); passivation; phosphorus; plasma CVD; semiconductor device metallisation; silicon; silicon compounds; solar cells; surface texture; 16.8 percent; MicroWave PECVD; Si:P; SiN; antireflection coating; belt furnace emitter diffusion; commercial multicrystalline silicon; homogeneous spin-on phosphorous; inline processing; passivation; screen-printed metallization; silicon nitride layers; solar cell; texturing; Belts; Electromagnetic heating; Etching; Furnaces; Infrared heating; Metallization; Performance evaluation; Photovoltaic cells; Reflectivity; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2005. Conference Record of the Thirty-first IEEE
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-8707-4
  • Type

    conf

  • DOI
    10.1109/PVSC.2005.1488385
  • Filename
    1488385