DocumentCode
1562064
Title
Qualification of phase change thermal interface material for wave solder heat sink on FCBGA package
Author
Bharatham, Logendran ; Fong, Wong Shaw ; Torresola, Javier ; Koang, Chen Chee
Author_Institution
Intel Technol.
Volume
2
fYear
2005
Abstract
This paper reports the outcome of multiple environmental stresses subjected to quantify the thermal impedance value (Rjs) of a phase change thermal interface material for wave solder heat sink on a bare die FCBGA package. Based on the accelerated reliability stresses, statistical models were created where possible to represent Rjs performance over time at use condition and temperatures using modifed Arrhenius type of equations. The lack of adequate pressure on the TIM produced significant material degradation in bake. However, the post reliability Rjs derived was still below the thermal design target of 1.96 degCcm2/W which, indicates that the TIM material can sufficiently cool the package until the end of its use life
Keywords
ball grid arrays; flip-chip devices; heat sinks; phase change materials; reliability; statistical analysis; thermal management (packaging); wave soldering; Arrhenius equations; FCBGA package; accelerated reliability stresses; material degradation; multiple environmental stresses; phase change thermal interface material; statistical models; thermal impedance value; wave solder heat sink; Acceleration; Equations; Heat sinks; Impedance; Packaging; Phase change materials; Qualifications; Temperature distribution; Thermal degradation; Thermal stresses;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology Conference, 2005. EPTC 2005. Proceedings of 7th
Conference_Location
Singapore
Print_ISBN
0-7803-9578-6
Type
conf
DOI
10.1109/EPTC.2005.1614462
Filename
1614462
Link To Document