• DocumentCode
    1562083
  • Title

    Yield optimization with correlated design parameters and non-symmetrical marginal distributions

  • Author

    Ponnambalam, K. ; Seifi, A. ; Vlach, J.

  • Author_Institution
    Dept. of Syst. Design Eng., Waterloo Univ., Ont., Canada
  • Volume
    4
  • fYear
    2003
  • Abstract
    This paper extends the recently developed hybrid method to find the optimal designs of systems with correlated non-gaussian random parameters. A double-bounded density function is used to approximate marginal distribution and a Frank copula is used to define dependence (a more general concept than correlation) among the random parameters. We use a Piecewise Ellipsoidal method to approximate the constraint region by a set of quadratic functions. The yield is estimated by a joint cumulative density function over a portion of the tolerance body contained in the feasible region. Yield maximization is done for positive and negative correlations and non-symmetrical marginal distributions, and tested on an example using Monte-Carlo simulation.
  • Keywords
    Monte Carlo methods; circuit optimisation; integrated circuit design; integrated circuit yield; Frank copula; Monte Carlo simulation; constraint region approximation; correlated nonGaussian random parameters; cumulative density function; double-bounded probability density function; hybrid method; integrated circuit; nonsymmetrical marginal distribution; optimal design; piecewise ellipsoidal approximation; quadratic function; yield optimization; Constraint optimization; Density functional theory; Design engineering; Design optimization; Hypercubes; Industrial engineering; Probability density function; Systems engineering and theory; Testing; Yield estimation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2003. ISCAS '03. Proceedings of the 2003 International Symposium on
  • Print_ISBN
    0-7803-7761-3
  • Type

    conf

  • DOI
    10.1109/ISCAS.2003.1206268
  • Filename
    1206268