• DocumentCode
    1562093
  • Title

    The method research of non-contact thickness measurement of transparent object with free-form surface

  • Author

    Wei, Wang ; Zaili, Dong ; Changyou, Liu

  • Author_Institution
    Inst. of Inf. Sci. & Eng., Shenyang Univ. of Technol., China
  • Volume
    5
  • fYear
    2004
  • Firstpage
    3837
  • Abstract
    This paper presents the method and algorithm for surface 3D information and thickness measurement of the free-form transparent objects. The measurement method based, on the principle of structure light. The analysis of the structure light was represented and the experiment results were given. The validity of the method was proved in this paper.
  • Keywords
    image sensors; thickness measurement; CCD image sensors; free form surface; noncontact thickness measurement; structure light analysis; surface 3D information; transparent object; Educational institutions; Information science; Laboratories; Paper technology; Robotics and automation; Thickness measurement; Transportation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Control and Automation, 2004. WCICA 2004. Fifth World Congress on
  • Print_ISBN
    0-7803-8273-0
  • Type

    conf

  • DOI
    10.1109/WCICA.2004.1342208
  • Filename
    1342208
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1562093