DocumentCode :
1562190
Title :
Effects of thermal, moisture and mechanical loading conditions on interfacial fracture toughness using Brazil-nut specimens
Author :
Loo, Shane ; Mhaisalkar, Subodh ; Zhang, Xueren ; Ng, Hun Shen ; Tee, Tong Yan
Author_Institution :
Nanyang Technol. Univ., Singapore
Volume :
2
fYear :
2005
Abstract :
Interfacial delamination is a common failure mode in multi-layered IC packages. In this paper, an experimental technique using Brazil-nut specimens is employed to determine the interfacial fracture toughness of an adhesively sandwiched joint with introduction of edge interfacial crack. The interface studied here is the die attach material/copper leadframe interface. Tensile loads are applied to the specimens at various loading angles until the failure of the samples. Design of experiments (DOE) is applied to study variations in strain rates and thickness of the sandwich structure. In addition, the effects of moisture content and temperature on the interfacial adhesion are investigated. For the DOEs conducted, as the loading angle increases from 20deg to 90deg, the interfacial fracture toughness decreases. It is found that moisture absorption and increase of temperature have detrimental effects on the die attach material and likewise results in a corresponding decrease in fracture toughness. Failure patterns of the delaminated surfaces were observed with the scanning electron microscope (SEM) to determine the cohesive/adhesive modes of failure. The fracture toughness and its corresponding mode mixity are determined from the measured critical load by finite element modeling computation
Keywords :
adhesives; design of experiments; failure analysis; finite element analysis; fracture toughness; integrated circuit packaging; microassembling; surface cracks; Brazil-nut specimens; adhesively sandwiched joint; copper leadframe interface; design of experiments; die attach material; edge interfacial crack; finite element model; interfacial adhesion; interfacial fracture toughness; mechanical loading conditions; moisture absorption; moisture content; scanning electron microscope; strain rates; thermal effects; Capacitive sensors; Copper; Delamination; Integrated circuit packaging; Microassembly; Moisture; Scanning electron microscopy; Temperature; Thermal loading; US Department of Energy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology Conference, 2005. EPTC 2005. Proceedings of 7th
Conference_Location :
Singapore
Print_ISBN :
0-7803-9578-6
Type :
conf
DOI :
10.1109/EPTC.2005.1614476
Filename :
1614476
Link To Document :
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