DocumentCode :
1562279
Title :
The use of online diagnostic systems for real-time quality assurance, control (and future continuous online optimization) in roll-to-roll amorphous silicon PV manufacturing
Author :
Ellison, Tim ; Call, Jon ; Dodge, David ; Karn, J. ; Kopf, Rob ; Liu, Rujiang ; Lycette, Mark
Author_Institution :
Energy Conversion Devices Inc., Troy, MI, USA
fYear :
2005
Firstpage :
1472
Lastpage :
1475
Abstract :
In partnership with the NREL/DOE PV Manufacturing R&D Program, Energy Conversion Devices, Inc. (ECD) has developed a comprehensive set of online diagnostic systems that allow real-time measurement of PV device characteristics in-situ during amorphous silicon (a-Si) deposition, prior to deposition of ITO, PV device characteristics measured include open-circuit voltage (Voc), charging rate (CR), and thickness (t) of each of the three cells in the triple-junction device. Measurements are made with an rms precision of about 0.05%, and at periods of 1 s to 1 min (1 cm to 1 m). The information from these systems is displayed real-time in the control room for online quality assurance (QA) and trouble-shooting. The diagnostics systems have been incorporated into software feedback loops to control film thicknesses. We are now beginning the development of programs for continuous online optimization.
Keywords :
amorphous semiconductors; closed loop systems; elemental semiconductors; quality assurance; semiconductor device manufacture; semiconductor device testing; silicon; solar cells; 1 cm to 1 m; 1 s to 1 min; Si; amorphous silicon deposition; charging rate; online diagnostic systems; online optimization; open-circuit voltage; real-time quality assurance; roll-to-roll amorphous silicon PV manufacturing; software feedback loops; triple-junction device; trouble-shooting; Amorphous silicon; Control systems; Energy conversion; Energy measurement; Manufacturing; Quality assurance; Real time systems; Research and development; Thickness measurement; US Department of Energy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 2005. Conference Record of the Thirty-first IEEE
ISSN :
0160-8371
Print_ISBN :
0-7803-8707-4
Type :
conf
DOI :
10.1109/PVSC.2005.1488420
Filename :
1488420
Link To Document :
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