DocumentCode
1562536
Title
Design practices and issues for simultaneous switching noise
Author
Takahashi, Narimasa ; Sato, Ken ; Honda, Yutaka
Author_Institution
Eng. & Technol. Services, IBM Japan, Kanagawa
Volume
2
fYear
2005
Abstract
This paper describes the modeling and the analysis methodology to evaluate simultaneous switching noise (SSN) for the combined system of the package with the 4-layer printed circuit board (PCB), which the 64 simultaneous switching outputs (SSOs) were included using a simple IBIS model. Simulation results showed that the ground plane in both package and PCB can be used as the reference to reduce SSN more effectively than the power plane. For the source synchronous timing technique such as used in a DDR SDRAM memory bus in the model shown in this paper, the skew control circuit technique is easy to apply in the chip design instead of using embedded capacitors in the package´s substrate. If the chip design applies both the skew control circuits for each data-signal group and slew-rate controlled output driver, SSN can keep within 5 percent of operational voltage based on the design practices and simulation results
Keywords
integrated circuit modelling; integrated circuit noise; printed circuits; IBIS model; PCB; embedded capacitors; package substrate; printed circuit board; simultaneous switching noise; simultaneous switching outputs; skew control circuit technique; source synchronous timing technique; Capacitors; Chip scale packaging; Circuit noise; Circuit simulation; DRAM chips; Power system modeling; Printed circuits; Switching circuits; Timing; Voltage control;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology Conference, 2005. EPTC 2005. Proceedings of 7th
Conference_Location
Singapore
Print_ISBN
0-7803-9578-6
Type
conf
DOI
10.1109/EPTC.2005.1614512
Filename
1614512
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