Title :
The fault detection of cross-check test scheme for infrared FPA
Author :
Sheu, Meng Lieh ; Sun, Tai Ping ; Lu, Chi Wen ; Shie, Man Chau
Abstract :
The increase of array size and decrease of cell size make the testing of infrared focal plane arrays (FPAs) difficult. A design for test scheme, cross-check test, for infrared FPAs is presented in this paper. For an array size of M by N, the testing times can be reduced from the order of M*N to M+N. An analysis of the fault detectability of the proposed test scheme is also presented in this paper.
Keywords :
CMOS integrated circuits; design for testability; fault diagnosis; focal planes; integrated circuit testing; readout electronics; CMOS process; FPA testing; array size; cell size; cross-check test scheme; design for test scheme; fault detectability; fault detection; infrared FPA; infrared focal plane array; readout circuit; sensor array; testing times; CMOS technology; Circuit testing; Electrical fault detection; Electronic equipment testing; Fault detection; Flip chip; Infrared detectors; Sensor arrays; Sensor phenomena and characterization; Switches;
Conference_Titel :
Circuits and Systems, 2003. ISCAS '03. Proceedings of the 2003 International Symposium on
Print_ISBN :
0-7803-7761-3
DOI :
10.1109/ISCAS.2003.1206372
