Title :
Efficient BIST schemes for RNS datapaths
Author :
Nikolos, D.G. ; Nikolos, D. ; Vergos, H.T. ; Efstathiou, C.
Author_Institution :
Dept. of Comput. Eng. & Inf., Patras Univ., Greece
Abstract :
It has recently been shown that accumulators can be used efficiently for test pattern generation as well as for test response compaction. In this paper we present a BIST scheme for accumulators where the accumulator is simultaneously used as a test pattern generator and a response compactor during its own testing. We also show that the proposed BIST scheme is especially suitable for accumulator, adder and multiplier-accumulator RNS channels leading to minimal hardware overhead and short test sequences.
Keywords :
adders; automatic test pattern generation; built-in self test; integrated circuit testing; logic testing; residue number systems; BIST schemes; RNS datapaths; accumulator RNS channels; accumulators; adder RNS channels; minimal hardware overhead; multiplier-accumulator RNS channels; response compactor; test pattern generation; test response compaction; test sequences; Adders; Automatic testing; Built-in self-test; Circuit testing; Delay; Digital signal processing; Hardware; Informatics; Integrated circuit testing; Test pattern generators;
Conference_Titel :
Circuits and Systems, 2003. ISCAS '03. Proceedings of the 2003 International Symposium on
Print_ISBN :
0-7803-7761-3
DOI :
10.1109/ISCAS.2003.1206377
