DocumentCode :
1563114
Title :
A method of outliers detection based on amend sequential probabilistic ratio analysis
Author :
Yang, Tianqi
Author_Institution :
Comput. Sci. Dept., Jinan Univ., Guangzhou, China
Volume :
5
fYear :
2004
Firstpage :
4327
Abstract :
Outlier detection is a statistical problem that has received considerable attention. A common approach is assuming that the (possible) outliers are generated by contaminating models. It is known that sequential probabilistic ratio analysis (ASPR) is not very sensitive to outliers. Therefore, identification of outliers is possible for exploring appropriate model structures and determining reliable estimates of parameters. This paper examines the use of amend sequential probabilistic ratio analysis for outlier detection. We develop identification indices for detecting observations that influence the SPR estimates, higher. Finally, an example is given to illustrate the daily average number of car manufacturing defects application in the proposed detection.
Keywords :
automobile manufacture; automobiles; parameter estimation; probability; statistical analysis; amend sequential probabilistic ratio analysis; car manufacturing defects; contaminating models; identification indices; model structures; outlier identification; outliers detection; parameter estimation; statistical problem; Computer science; Manufacturing; Parameter estimation; Sequential analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Intelligent Control and Automation, 2004. WCICA 2004. Fifth World Congress on
Print_ISBN :
0-7803-8273-0
Type :
conf
DOI :
10.1109/WCICA.2004.1342329
Filename :
1342329
Link To Document :
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