Title :
Structural features of ZnOxS1???x nanostructured films
Author :
Berestok, T.O. ; Opanasyuk, A.S. ; Opanasyuk, N.M.
Author_Institution :
Sumy State Univ., Sumy, Ukraine
Abstract :
In this paper, ZnOxS1-x nanostructured layers were obtained by chemical bath deposition from solutions of zinc acetate, ammonia and thiourea. Structural features of ZnOxS1-x films were studied by scanning electron microscopy and X-ray diffraction. The effect of condensation time on the elemental and phase composition of the thin layers, as well as their structural characteristics, such as lattice constants and growth texture, were found.
Keywords :
II-VI semiconductors; X-ray diffraction; condensation; liquid phase deposition; nanofabrication; nanostructured materials; scanning electron microscopy; semiconductor growth; semiconductor thin films; texture; wide band gap semiconductors; zinc compounds; X-ray diffraction; ZnOxS1-x; ammonia solutions; chemical bath deposition; condensation time; elemental composition; growth texture; lattice constants; phase composition; scanning electron microscopy; structural properties; thin layers; thiourea solutions; zinc acetate solutions; zinc oxide nanostructured films; Annealing; Nickel;
Conference_Titel :
Microwave & Telecommunication Technology (CriMiCo), 2014 24th International Crimean Conference
Conference_Location :
Sevastopol
Print_ISBN :
978-966-335-412-5
DOI :
10.1109/CRMICO.2014.6959627
