DocumentCode
1564468
Title
Quantifying Loading Efficiency Losses on Lithography Clusters
Author
Foster, Jason ; Mohile, Milind ; Matthews, John
Author_Institution
Qimonda NA Corp., Sandston, VA
fYear
2008
Firstpage
179
Lastpage
184
Abstract
The high cost of lithography clusters requires fabs to continuously work to optimize their utilization and output. Unfortunately, due to their highly complex nature and the parallel processing capability of the cluster, accurately determining the utilization and output detractors can be very difficult. Without the ability to accurately identify and quantify the equipment capacity loss it is obviously very difficult to improve the equipment performance, as well as to synchronize actual equipment performance with capacity planning. At Qimonda, we have measured several speed losses on our Lithography clusters with interrupts to takt time consistently being the largest. Interrupt losses can be divided into two general categories of causes: equipment alarms/aborts and loading efficiency.
Keywords
lithography; parallel processing; planning; capacity planning; lithography clusters; parallel processing; Capacity planning; Cost function; Lithography; Loss measurement; Manufacturing processes; Parallel processing; Performance loss; Steady-state; Time measurement; Velocity measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Semiconductor Manufacturing Conference, 2008. ASMC 2008. IEEE/SEMI
Conference_Location
Cambridge, MA
ISSN
1078-8743
Print_ISBN
978-1-4244-1964-7
Electronic_ISBN
1078-8743
Type
conf
DOI
10.1109/ASMC.2008.4529025
Filename
4529025
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