• DocumentCode
    1564468
  • Title

    Quantifying Loading Efficiency Losses on Lithography Clusters

  • Author

    Foster, Jason ; Mohile, Milind ; Matthews, John

  • Author_Institution
    Qimonda NA Corp., Sandston, VA
  • fYear
    2008
  • Firstpage
    179
  • Lastpage
    184
  • Abstract
    The high cost of lithography clusters requires fabs to continuously work to optimize their utilization and output. Unfortunately, due to their highly complex nature and the parallel processing capability of the cluster, accurately determining the utilization and output detractors can be very difficult. Without the ability to accurately identify and quantify the equipment capacity loss it is obviously very difficult to improve the equipment performance, as well as to synchronize actual equipment performance with capacity planning. At Qimonda, we have measured several speed losses on our Lithography clusters with interrupts to takt time consistently being the largest. Interrupt losses can be divided into two general categories of causes: equipment alarms/aborts and loading efficiency.
  • Keywords
    lithography; parallel processing; planning; capacity planning; lithography clusters; parallel processing; Capacity planning; Cost function; Lithography; Loss measurement; Manufacturing processes; Parallel processing; Performance loss; Steady-state; Time measurement; Velocity measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Manufacturing Conference, 2008. ASMC 2008. IEEE/SEMI
  • Conference_Location
    Cambridge, MA
  • ISSN
    1078-8743
  • Print_ISBN
    978-1-4244-1964-7
  • Electronic_ISBN
    1078-8743
  • Type

    conf

  • DOI
    10.1109/ASMC.2008.4529025
  • Filename
    4529025