• DocumentCode
    1564566
  • Title

    Early Detection of a Manufacturing Problem using Product Test Data

  • Author

    Beutl, Michael ; Prossegger, Alexander ; Wawrina, Axel ; Rathei, Dieter

  • Author_Institution
    Schloss Premstatten, Austriamicrosystems AG, Unterpremstatten
  • fYear
    2008
  • Firstpage
    114
  • Lastpage
    116
  • Abstract
    The use of product test data for manufacturing control has been repeatedly suggested in various papers and talks [1,2], and a working implementation has been presented by some of us using the YieldWatchDogTM software [3]. This paper presents a case study demonstrating how this software can be used to detect imminent production problems.
  • Keywords
    integrated circuit manufacture; integrated circuit testing; YieldWatchDog software; imminent production problems; manufacturing problem; product test data; Computer aided software engineering; Condition monitoring; Parametric statistics; Probes; Production; Pulp manufacturing; Signal design; Signal processing; Software testing; Statistical analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Manufacturing Conference, 2008. ASMC 2008. IEEE/SEMI
  • Conference_Location
    Cambridge, MA
  • ISSN
    1078-8743
  • Print_ISBN
    978-1-4244-1964-7
  • Electronic_ISBN
    1078-8743
  • Type

    conf

  • DOI
    10.1109/ASMC.2008.4529035
  • Filename
    4529035
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1564566