DocumentCode
1564817
Title
Test Wafer Management and Automated Wafer Sorting
Author
Faruqi, Aziza ; Goss, Raymond ; Adhikari, Diwas ; Kowtsch, Thomas
Author_Institution
Adv. Micro Devices, Austin, TX
fYear
2008
Firstpage
322
Lastpage
326
Abstract
Typical usage of test wafers (TW) in semiconductor manufacturing involves testing and development of new processes, equipment qualification, and process monitoring activities. A 300 mm fab can potentially spend millions of dollars each year purchasing test wafers. Over the years, improvements in TW management systems have led to a reduction in cost by enabling better inventory control. However, even with the increased level of automation of 300 mm fabs, the TW management process still leaves much to be automated. In this paper, we describe an automated TW management system and the performance benefits derived from its usage.
Keywords
process monitoring; semiconductor device manufacture; test equipment; automated wafer sorting; process monitoring; semiconductor manufacturing; test wafer management; Automatic testing; Costs; Inventory control; Inventory management; Manufacturing processes; Monitoring; Qualifications; Semiconductor device manufacture; Semiconductor device testing; Sorting; Equipment Qualification; Factory Automation; Sorter Automation; Test Wafer Management; Wafer Sorting;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Semiconductor Manufacturing Conference, 2008. ASMC 2008. IEEE/SEMI
Conference_Location
Cambridge, MA
ISSN
1078-8743
Print_ISBN
978-1-4244-1964-7
Electronic_ISBN
1078-8743
Type
conf
DOI
10.1109/ASMC.2008.4529062
Filename
4529062
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