• DocumentCode
    1564817
  • Title

    Test Wafer Management and Automated Wafer Sorting

  • Author

    Faruqi, Aziza ; Goss, Raymond ; Adhikari, Diwas ; Kowtsch, Thomas

  • Author_Institution
    Adv. Micro Devices, Austin, TX
  • fYear
    2008
  • Firstpage
    322
  • Lastpage
    326
  • Abstract
    Typical usage of test wafers (TW) in semiconductor manufacturing involves testing and development of new processes, equipment qualification, and process monitoring activities. A 300 mm fab can potentially spend millions of dollars each year purchasing test wafers. Over the years, improvements in TW management systems have led to a reduction in cost by enabling better inventory control. However, even with the increased level of automation of 300 mm fabs, the TW management process still leaves much to be automated. In this paper, we describe an automated TW management system and the performance benefits derived from its usage.
  • Keywords
    process monitoring; semiconductor device manufacture; test equipment; automated wafer sorting; process monitoring; semiconductor manufacturing; test wafer management; Automatic testing; Costs; Inventory control; Inventory management; Manufacturing processes; Monitoring; Qualifications; Semiconductor device manufacture; Semiconductor device testing; Sorting; Equipment Qualification; Factory Automation; Sorter Automation; Test Wafer Management; Wafer Sorting;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Manufacturing Conference, 2008. ASMC 2008. IEEE/SEMI
  • Conference_Location
    Cambridge, MA
  • ISSN
    1078-8743
  • Print_ISBN
    978-1-4244-1964-7
  • Electronic_ISBN
    1078-8743
  • Type

    conf

  • DOI
    10.1109/ASMC.2008.4529062
  • Filename
    4529062