Current induced magnetization switching: quasi-static and dynamics

Author

Fabian, A. ; Wegrowe, J.-E. ; Guittienne, Ph. ; Wade, T. ; Gravier, L. ; Ansermet, J.-Ph.

Author_Institution

Inst. de Phys. Exp., Ecole Polytech. Fed. de Lausanne, Switzerland

fYear

2002

Abstract

Summary form only given. The direct effect of the current on magnetization reversal is studied with different protocols on various electrodeposited magnetic nanowires of controlled morphology (diameter about 60 nm) (J.-E. Wegrowe et al, J. Appl. Phys. vol. 89, p. 7127, 2001). Three protocols were used: DC current injection, sub-microsecond pulse, and after-effect measurements with nanosecond resolution. The effect of the current in terms of barrier height is quantified (P. Guittienne, IEEE Trans. Mag. vol. 37, p. 2126, 2001). The three protocols are applied to two different structures: uniform Ni nanowires (6000 nm long) and two layer pseudo-spin valves with CPP geometry of Co(30 nm)/Cu(10 nm)/Co(10 nm).

Keywords

electric current; electrodeposits; magnetisation reversal; micromagnetics; nanowires; spin valves; 10 nm; 30 nm; 60 nm; 6000 nm; Co-Cu-Co; Co/Cu/Co pseudo-spin valve CPP geometry; DC current injection protocol; Ni; after-effect measurement protocol; controlled morphology; current induced magnetization switching; direct current effect; dynamic analysis; electrodeposited magnetic nanowires; magnetization reversal; quasi-static analysis; sub-microsecond pulse protocol; uniform Ni nanowires; Acceleration; Magnetic field measurement; Magnetic switching; Magnetic tunneling; Magnetization; Nanowires; Oxidation; Protocols; Stress; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International

Conference_Location

Amsterdam, The Netherlands

Print_ISBN

0-7803-7365-0

Type

conf

DOI

10.1109/INTMAG.2002.1000762

Filename

1000762