DocumentCode
1564921
Title
Advanced Micro-Optics Solutions for Laser-Based Semiconductor Processes
Author
Homburg, O. ; Hauschild, D. ; Harten, P. ; Aschk, L.
Author_Institution
LIMO Lissotschenko Mikroopt. GmbH, Dortmund
fYear
2008
Firstpage
366
Lastpage
371
Abstract
Optical technologies are crucial and widely used in semiconductor technology. Compared to traditional approaches with macro-lenses micro-optics solutions offer new possibilities for all kinds of semiconductor manufacturing. With refractive free-form micro-lenses a large variety of beam shapes can be generated where top hat profiles with homogeneous intensity distributions are the most prominent ones. Beam shaping principles of micro-lens systems are outlined and four prominent application examples are demonstrated. The most famous process is optical lithography where tiny structures down to 32 nm or even below are feasible. Homogeneous off-axis illumination becomes possible due to asymmetrical micro-lens arrays which can be utilized in various illumination and inspection systems. The laser-based structuring of trenches, e.g. wafer scribing and dicing, is significantly enhanced by top hat compared to Gaussian beam profiles. Laser-based annealing results are shown on silicon for a green laser line and a near-infrared line generator.
Keywords
laser beam annealing; lenses; micro-optics; Gaussian beam profiles; beam shaping principles; green laser line; homogeneous intensity distributions; illumination-inspection systems; laser-based annealing; laser-based semiconductor processes; macrolenses microoptics solutions; microoptics solutions; near-infrared line generator; optical lithography process; semiconductor manufacturing; Annealing; Inspection; Laser beams; Lighting; Lithography; Optical refraction; Semiconductor device manufacture; Semiconductor lasers; Shape; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Semiconductor Manufacturing Conference, 2008. ASMC 2008. IEEE/SEMI
Conference_Location
Cambridge, MA
ISSN
1078-8743
Print_ISBN
978-1-4244-1964-7
Electronic_ISBN
1078-8743
Type
conf
DOI
10.1109/ASMC.2008.4529072
Filename
4529072
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