• DocumentCode
    1564921
  • Title

    Advanced Micro-Optics Solutions for Laser-Based Semiconductor Processes

  • Author

    Homburg, O. ; Hauschild, D. ; Harten, P. ; Aschk, L.

  • Author_Institution
    LIMO Lissotschenko Mikroopt. GmbH, Dortmund
  • fYear
    2008
  • Firstpage
    366
  • Lastpage
    371
  • Abstract
    Optical technologies are crucial and widely used in semiconductor technology. Compared to traditional approaches with macro-lenses micro-optics solutions offer new possibilities for all kinds of semiconductor manufacturing. With refractive free-form micro-lenses a large variety of beam shapes can be generated where top hat profiles with homogeneous intensity distributions are the most prominent ones. Beam shaping principles of micro-lens systems are outlined and four prominent application examples are demonstrated. The most famous process is optical lithography where tiny structures down to 32 nm or even below are feasible. Homogeneous off-axis illumination becomes possible due to asymmetrical micro-lens arrays which can be utilized in various illumination and inspection systems. The laser-based structuring of trenches, e.g. wafer scribing and dicing, is significantly enhanced by top hat compared to Gaussian beam profiles. Laser-based annealing results are shown on silicon for a green laser line and a near-infrared line generator.
  • Keywords
    laser beam annealing; lenses; micro-optics; Gaussian beam profiles; beam shaping principles; green laser line; homogeneous intensity distributions; illumination-inspection systems; laser-based annealing; laser-based semiconductor processes; macrolenses microoptics solutions; microoptics solutions; near-infrared line generator; optical lithography process; semiconductor manufacturing; Annealing; Inspection; Laser beams; Lighting; Lithography; Optical refraction; Semiconductor device manufacture; Semiconductor lasers; Shape; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Manufacturing Conference, 2008. ASMC 2008. IEEE/SEMI
  • Conference_Location
    Cambridge, MA
  • ISSN
    1078-8743
  • Print_ISBN
    978-1-4244-1964-7
  • Electronic_ISBN
    1078-8743
  • Type

    conf

  • DOI
    10.1109/ASMC.2008.4529072
  • Filename
    4529072