• DocumentCode
    156512
  • Title

    Radiation effects in phase-locked loop

  • Author

    Elesin, Vadim V. ; Kuznetsov, Alexander G. ; Sotskov, D.I.

  • Author_Institution
    Moscow Eng. Phys. Inst., Nat. Res. Nucl. Univ. MEPhI, Moscow, Russia
  • fYear
    2014
  • fDate
    7-13 Sept. 2014
  • Firstpage
    858
  • Lastpage
    859
  • Abstract
    An analysis of total dose and dose rate effects in phase-locked loop (PLL) ICs is presented. New radiation hardness test results for a variety of commercial and experimental PLL ICs are obtained.
  • Keywords
    phase locked loops; radiation hardening (electronics); dose rate effects; phase locked loop; radiation effects; radiation hardness test; CMOS integrated circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave & Telecommunication Technology (CriMiCo), 2014 24th International Crimean Conference
  • Conference_Location
    Sevastopol
  • Print_ISBN
    978-966-335-412-5
  • Type

    conf

  • DOI
    10.1109/CRMICO.2014.6959664
  • Filename
    6959664
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=156512