Title :
Single event effects in RF and microwave ICs
Author :
Chukov, George V. ; Elesin, Vadim V. ; Boychenko, Dmitry V. ; Kuznetsov, Alexander G. ; Amburkin, Konstantin M.
Author_Institution :
Moscow Eng. Phys. Inst., Nat. Res. Nucl. Univ. MEPhI, Moscow, Russia
Abstract :
The present paper presents an overview and an analysis of single event effects (SEE) for a variety of RF and microwave ICs. New SEE test results obtained at the NRNU MEPhI test center have been used along with the published data.
Keywords :
microwave integrated circuits; radiation hardening (electronics); RF IC; SEE test results; microwave IC; single event effects; Microwave integrated circuits;
Conference_Titel :
Microwave & Telecommunication Technology (CriMiCo), 2014 24th International Crimean Conference
Conference_Location :
Sevastopol
Print_ISBN :
978-966-335-412-5
DOI :
10.1109/CRMICO.2014.6959665
