Title :
New approach to dose rate testing of MW ICs based on heterostructures
Author :
Chukov, George V. ; Amburkin, Konstantin M.
Author_Institution :
Moscow Eng. Phys. Inst., Nat. Res. Nucl. Univ. MEPhI, Moscow, Russia
Abstract :
The present paper concerns some testing peculiarities for GaAs MW IC´s based on heterostructures in the context of ionizing pulse radiation effect. Comparative analysis of experimental results achieved using a small-size pulsed accelerator and a pulse laser source with a variable wavelength is performed. The parameters of laser radiation that ensure adequate simulation of dose rate effects are determined.
Keywords :
III-V semiconductors; dosimetry; gallium arsenide; microwave integrated circuits; radiation effects; GaAs; MW IC; dose rate testing; ionizing pulse radiation effect; laser radiation; pulse laser source; pulsed accelerator; Radiation effects;
Conference_Titel :
Microwave & Telecommunication Technology (CriMiCo), 2014 24th International Crimean Conference
Conference_Location :
Sevastopol
Print_ISBN :
978-966-335-412-5
DOI :
10.1109/CRMICO.2014.6959667
