Title :
Comparison of MFM/STM data of patterned ultra thin iron films grown on Si [001] and NiO in UHV
Author :
Dreyer, M. ; Krafft, Christoph ; Gomez, R.D.
Author_Institution :
Lab. for Phys. Sci., College Park, MD, USA
Abstract :
Summary form only given. The topographic and magnetic structures of thin Fe films grown on Si [001] and polycrystalline NiO substrates are compared in situ by UHV STM/MFM measurements to investigate the influence of exchange coupling.
Keywords :
exchange interactions (electron); ferromagnetic materials; iron; magnetic force microscopy; magnetic structure; magnetic thin films; scanning tunnelling microscopy; surface magnetism; surface topography; vacuum deposited coatings; Fe; MFM/STM data; NiO; Si; Si [001]; UHV; UHV STM/MFM measurements; exchange coupling; magnetic structures; patterned ultra thin iron films; polycrystalline NiO substrates; thin Fe films; topographic structures; Couplings; Educational institutions; Heating; Iron; Magnetic films; Magnetic force microscopy; Magnetic hysteresis; Semiconductor films; Substrates; Surfaces;
Conference_Titel :
Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International
Conference_Location :
Amsterdam, The Netherlands
Print_ISBN :
0-7803-7365-0
DOI :
10.1109/INTMAG.2002.1000790
