Title :
Reflectometry based on two-photon absorption of a silicon avalanche photodiode
Author :
Tanaka, Y. ; Chua, P.G. ; Kurokawa, T. ; Tsuda, H. ; Naganuma, M. ; Takeda, M.
Author_Institution :
Tokyo Univ. of Agric. & Technol., Koganei, Japan
Abstract :
Proposed and demonstrated a novel reflectometry system based on two-photon absorption process in a silicon photodetector. This method can measure the optical path difference of several millimeters to several meters with a simple system configuration. The study on improving the accuracy and resolution is currently under investigation. We also plan to apply the same method to measuring the surface shape of objects using the two-photon absorption of silicon image sensors.
Keywords :
avalanche photodiodes; infrared detectors; reflectometry; two-photon processes; Si; accuracy; avalanche photodiode; optical path difference; reflectometry system; resolution; surface shape; two-photon absorption; Absorption; Amplitude modulation; Avalanche photodiodes; Optical modulation; Optical signal processing; Photoconductivity; Photodetectors; Pulse measurements; Reflectometry; Silicon;
Conference_Titel :
Optical Fiber Sensors Conference Technical Digest, 2002. Ofs 2002, 15th
Conference_Location :
Portland, OR, USA
Print_ISBN :
0-7803-7289-1
DOI :
10.1109/OFS.2002.1000807
