Title :
Magnetization estimation from MFM images
Author :
Chi-Chun Hsu ; Miller, C.T. ; Indeck, R.S. ; O´Sullivan, J.A. ; Muller, M.W.
Author_Institution :
Magnetics & Inf. Sci. Center, Washington Univ., St. Louis, MO, USA
Abstract :
Summary form only given. Magnetic force microscopy (MFM) measurements only provide information about the divergence of the magnetization being studied. To fully understand such details as magnetic stability and storage capacity, the complete magnetization is needed. We outline two methods of obtaining useful estimates of the total vector magnetization in thin film longitudinal media from MFM measurements and display simulation results.
Keywords :
digital simulation; magnetic film stores; magnetic force microscopy; magnetic thin films; magnetisation; MFM images; magnetic force microscopy; magnetic stability; magnetic storage capacity; magnetization divergence; magnetization estimation; simulation; thin film longitudinal media; total vector magnetization; Couplings; Force measurement; Grain boundaries; Image reconstruction; Magnetic force microscopy; Magnetic forces; Magnetization; Magnetostriction; Switches; Transistors;
Conference_Titel :
Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International
Conference_Location :
Amsterdam, The Netherlands
Print_ISBN :
0-7803-7365-0
DOI :
10.1109/INTMAG.2002.1000812
