DocumentCode
156549
Title
Ultra-short pulse characterization of dielectrics with simultaneous evaluation of conduction, relaxation losses and dielectric nonlinearity
Author
Semyonov, E.V.
Author_Institution
Tomsk State Univ. of Control Syst. & Radioelectron., Tomsk, Russia
fYear
2014
fDate
7-13 Sept. 2014
Firstpage
912
Lastpage
913
Abstract
A method for the characterization of dielectrics allowing simultaneous measuring of relaxation, conduction losses and dielectric nonlinearity at the short-pulse impact is proposed. In this case we may evaluate the function of the instantaneous power loss versus time. An example of practical measurement of characteristics of two capacitors with very different relaxation losses is given.
Keywords
capacitors; dielectric measurement; dielectric properties; losses; conduction loss; dielectric characterization; dielectric nonlinearity; relaxation loss; ultrashort pulse characterization; Capacitance;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave & Telecommunication Technology (CriMiCo), 2014 24th International Crimean Conference
Conference_Location
Sevastopol
Print_ISBN
978-966-335-412-5
Type
conf
DOI
10.1109/CRMICO.2014.6959690
Filename
6959690
Link To Document