Title :
Ultra-short pulse characterization of dielectrics with simultaneous evaluation of conduction, relaxation losses and dielectric nonlinearity
Author_Institution :
Tomsk State Univ. of Control Syst. & Radioelectron., Tomsk, Russia
Abstract :
A method for the characterization of dielectrics allowing simultaneous measuring of relaxation, conduction losses and dielectric nonlinearity at the short-pulse impact is proposed. In this case we may evaluate the function of the instantaneous power loss versus time. An example of practical measurement of characteristics of two capacitors with very different relaxation losses is given.
Keywords :
capacitors; dielectric measurement; dielectric properties; losses; conduction loss; dielectric characterization; dielectric nonlinearity; relaxation loss; ultrashort pulse characterization; Capacitance;
Conference_Titel :
Microwave & Telecommunication Technology (CriMiCo), 2014 24th International Crimean Conference
Conference_Location :
Sevastopol
Print_ISBN :
978-966-335-412-5
DOI :
10.1109/CRMICO.2014.6959690
