Title :
High Speed Piezo Force Microscopy: Nanoscale and nanosecond direct observations of domain switching
Author :
Nath, R. ; Polomoff, N. ; Bosse, J. ; Chu, Y. H. ; Ramesh, Ramaswamy ; Huey, B. D.
Author_Institution :
Institute of Materials Science, University of Connecicut, Storrs, 06269, USA
Abstract :
High Speed Piezo Force Microscopy (HSPFM) is a new variation of Atomic Force Miroscopy (AFM) for direct nanoscale measurements of domain switching dynamics. Image acquisition is accelerated from several minutes for standard piezo force microscopy to as fast as a fraction of a second for HSPFM. Movies of consecutive images during in-situ domain switching therefore allow high spatial and temporal resolution, with less than 500 nanosecond poling per pixel achieved. The influence of individual defects on domain nucleation, growth mechanisms, switching speed, and switching energy are therefore uniquely apparent.
Keywords :
Acceleration; Atomic force microscopy; Atomic measurements; Energy resolution; Force measurement; Image resolution; Motion pictures; Pixel; Spatial resolution; Velocity measurement;
Conference_Titel :
Applications of Ferroelectrics, 2008. ISAF 2008. 17th IEEE International Symposium on the
Conference_Location :
Santa Re, NM, USA
Print_ISBN :
978-1-4244-2744-4
Electronic_ISBN :
1099-4734
DOI :
10.1109/ISAF.2008.4688109
