Title :
Analysis of differential entropy at two-parameter technical measurements
Author :
Kopp, V.Ya. ; Balakin, A.I. ; Chuyko, E.A. ; Zori, A.A.
Author_Institution :
Sevastopol Nat. Tech. Univ., Sevastopol, Russia
Abstract :
The questions of improving the accuracy of measuring equipment are considered. The present paper concerns the theorem on the maximum of differential entropy of the two-dimensional random variable bounded finite limits with its defined mathematical expectation, variance and correlation moments.
Keywords :
mathematical analysis; maximum entropy methods; accuracy improvement; correlation moments; defined mathematical expectation; maximum differential entropy analysis; measuring equipment; two-dimensional random variable bounded finite limits; two-parameter technical measurements; variance moments; Committees; Communications technology; Entropy; IEEE catalog; Microwave measurement; Microwave technology; Organizing;
Conference_Titel :
Microwave & Telecommunication Technology (CriMiCo), 2014 24th International Crimean Conference
Conference_Location :
Sevastopol
Print_ISBN :
978-966-335-412-5
DOI :
10.1109/CRMICO.2014.6959707
