DocumentCode :
1565820
Title :
CH003: Stability of nanodots in ferroelectric thin films
Author :
Balke, N. ; Yu, Paul ; Wang, L.-P. ; Ramesh, Ramaswamy
Author_Institution :
Department of Materials Science and Engineering, University of California Berkeley, 100 Hearst Memorial Mining Building, 94720, USA
fYear :
2008
Firstpage :
1
Lastpage :
2
Abstract :
Retention properties of written nanodots for Pb(Zr0.2Ti0.8)O3 have been investigated. The imaging voltage plays an important role when investigating small unstable domains. Even with an imaging voltage far below the coercive voltage the boundaries of the domains are switched during imaging by what the measured nanodomain stability is strongly influenced
Keywords :
Atomic force microscopy; Ferroelectric materials; Performance evaluation; Piezoelectric films; Pulse measurements; Pulsed laser deposition; Stability; Transistors; Voltage; Writing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applications of Ferroelectrics, 2008. ISAF 2008. 17th IEEE International Symposium on the
Conference_Location :
Santa Re, NM, USA
ISSN :
1099-4734
Print_ISBN :
978-1-4244-2744-4
Electronic_ISBN :
1099-4734
Type :
conf
DOI :
10.1109/ISAF.2008.4688111
Filename :
4688111
Link To Document :
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