• DocumentCode
    1566267
  • Title

    Dependence of thermo-magnetic mark size on applied STM voltage in Co/Pt multilayers

  • Author

    Li Zhang ; Bain, James A. ; Jian-Gang Zhu

  • Author_Institution
    Data Storage Syst. Center, Carnegie Mellon Univ., Pittsburgh, PA, USA
  • fYear
    2002
  • Abstract
    Summary form only given. We present characterization of a magnetic recording process potentially suitable for proposed probe-based storage systems. A scanning tunneling microscope (STM) is used to locally heat a uniformly magnetized perpendicular recording medium. In this work, a 10 nm thick Co/Pt multilayer thin film was used as the recording medium. Pulsed heating of the medium was done using the STM mode of a DI Nanoscope III. Detailed measurement of mark size vs. pulse amplitude (tip-sample spacing controlled at 20 mV bias and 2 nA of tunneling current) shows a relatively constant mark diameter of about 220 nm (theoretical calculation shows the minimum stable domain size for Co/Pt is /spl sim/100 nm), when the voltage is above a threshold of 2 V. This result contradicts previous results by J. Nakamura et al. (see J. Appl. Phys., vol. 77, p. 779-781, 1995), which showed increasing mark size with increasing applied voltage. By using a model of field emission from an STM, we suggest this discrepancy is due to the change in tip-sample spacing during writing due to reaction of the mechanical system. The threshold phenomenon may be due to the threshold of domain nucleation and breakdown current to follow through.
  • Keywords
    cobalt; field emission; multilayers; platinum; scanning tunnelling microscopy; thermomagnetic recording; 100 nm; 2 V; 2 nA; 20 mV; 220 nm; Co-Pt; Co/Pt multilayer thin film; STM; applied STM voltage; breakdown current; domain nucleation; field emission model; magnetic recording process characterization; probe-based storage systems; recording medium local heating; scanning tunneling microscope; thermo-magnetic mark size dependence; threshold phenomenon; tip-sample spacing variation; uniformly magnetized perpendicular recording medium; writing process; Heating; Magnetic force microscopy; Magnetic multilayers; Magnetic recording; Nonhomogeneous media; Perpendicular magnetic recording; Size measurement; Transistors; Tunneling; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International
  • Conference_Location
    Amsterdam, The Netherlands
  • Print_ISBN
    0-7803-7365-0
  • Type

    conf

  • DOI
    10.1109/INTMAG.2002.1000889
  • Filename
    1000889