DocumentCode
1566267
Title
Dependence of thermo-magnetic mark size on applied STM voltage in Co/Pt multilayers
Author
Li Zhang ; Bain, James A. ; Jian-Gang Zhu
Author_Institution
Data Storage Syst. Center, Carnegie Mellon Univ., Pittsburgh, PA, USA
fYear
2002
Abstract
Summary form only given. We present characterization of a magnetic recording process potentially suitable for proposed probe-based storage systems. A scanning tunneling microscope (STM) is used to locally heat a uniformly magnetized perpendicular recording medium. In this work, a 10 nm thick Co/Pt multilayer thin film was used as the recording medium. Pulsed heating of the medium was done using the STM mode of a DI Nanoscope III. Detailed measurement of mark size vs. pulse amplitude (tip-sample spacing controlled at 20 mV bias and 2 nA of tunneling current) shows a relatively constant mark diameter of about 220 nm (theoretical calculation shows the minimum stable domain size for Co/Pt is /spl sim/100 nm), when the voltage is above a threshold of 2 V. This result contradicts previous results by J. Nakamura et al. (see J. Appl. Phys., vol. 77, p. 779-781, 1995), which showed increasing mark size with increasing applied voltage. By using a model of field emission from an STM, we suggest this discrepancy is due to the change in tip-sample spacing during writing due to reaction of the mechanical system. The threshold phenomenon may be due to the threshold of domain nucleation and breakdown current to follow through.
Keywords
cobalt; field emission; multilayers; platinum; scanning tunnelling microscopy; thermomagnetic recording; 100 nm; 2 V; 2 nA; 20 mV; 220 nm; Co-Pt; Co/Pt multilayer thin film; STM; applied STM voltage; breakdown current; domain nucleation; field emission model; magnetic recording process characterization; probe-based storage systems; recording medium local heating; scanning tunneling microscope; thermo-magnetic mark size dependence; threshold phenomenon; tip-sample spacing variation; uniformly magnetized perpendicular recording medium; writing process; Heating; Magnetic force microscopy; Magnetic multilayers; Magnetic recording; Nonhomogeneous media; Perpendicular magnetic recording; Size measurement; Transistors; Tunneling; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International
Conference_Location
Amsterdam, The Netherlands
Print_ISBN
0-7803-7365-0
Type
conf
DOI
10.1109/INTMAG.2002.1000889
Filename
1000889
Link To Document