Title :
Composite bitmap visualization techniques for advanced ferroelectric memories
Author :
Eliason, J. ; Staubs, P. ; Groat, J. ; Rodriguez, Jose
Author_Institution :
Ramtron International Corporation, Colorado Springs, 80921, USA
Abstract :
The year 2007 was a breakout year for advanced F-RAM. Two products manufactured on Texas Instruments’ 130nm ferroelectric memory process are now commercially available from Ramtron, and TI announced its intention to leverage the benefits of F-RAM in next generation RFID products. New composite bitmap visualization software created by Ramtron aided the development of a reliable process and manufacturable products. This paper will describe and demonstrate some of the powerful data analysis techniques enabled by this software.
Keywords :
Capacitors; Data analysis; Ferroelectric materials; Instruments; Manufacturing processes; Random access memory; Springs; Testing; Visualization; Voltage;
Conference_Titel :
Applications of Ferroelectrics, 2008. ISAF 2008. 17th IEEE International Symposium on the
Conference_Location :
Santa Re, NM, USA
Print_ISBN :
978-1-4244-2744-4
Electronic_ISBN :
1099-4734
DOI :
10.1109/ISAF.2008.4688163
