Title :
Ferroelectric SPICE model, testing and fitting
Author :
Summerfelt, Scott R. ; Rodriguez, John R. ; McAdams, Hugh P.
Author_Institution :
Analog Technology Development, Texas Instruments Inc., Dallas, USA
Abstract :
Design of ferroelectric memories, F-RAMs, requires an accurate ferroelectric SPICE model. The goal of a good SPICE model is to predict the behavior of the ferroelectric capacitor in the circuit environment.
Keywords :
Capacitors; Circuit testing; Ferroelectric materials; Instruments; Mathematical model; Paper technology; Random access memory; SPICE; Ultrasonics, ferroelectrics, and frequency control; Very large scale integration;
Conference_Titel :
Applications of Ferroelectrics, 2008. ISAF 2008. 17th IEEE International Symposium on the
Conference_Location :
Santa Re, NM, USA
Print_ISBN :
978-1-4244-2744-4
Electronic_ISBN :
1099-4734
DOI :
10.1109/ISAF.2008.4688165
