Title :
The infrared dynamic image identification based on the MOS resistance arrays
Author :
Wang, Xin ; Feng, Dongzhu
Author_Institution :
Coll. of Astronaut., Northwestern Polytech. Univ., Xi´´an
Abstract :
The thermoelectric characterization of MOS-based resistance arrays has been studied, including the resistance array unit and the structure of resistance arrays. The MOS resistance arrays infrared image nonuniformity was explored. A novel method based on thermal image realtime compensation has been developed, which was used to temperature infrared detector units. Arrays with 64times64 units and primary capability of thermal imaging were reported. An infrared dynamic image identification algorithm based on the grey relational analysis (GRA) was present. The results showed that arrays had a capability to identify thermal images. This can be useful for the infrared imaging systems design and analysis.
Keywords :
grey systems; infrared imaging; MOS resistance arrays; grey relational analysis; infrared dynamic image identification; infrared image nonuniformity; thermal image realtime compensation; thermoelectric characterization; Algorithm design and analysis; Heuristic algorithms; Image analysis; Infrared detectors; Infrared imaging; Optical imaging; System analysis and design; Temperature; Thermal resistance; Thermoelectricity; Grey Relational Analysis; Infrared Image Identification; MOS Resistance Arrays; Nonuniformity; Realtime Compensation;
Conference_Titel :
Anti-counterfeiting, Security and Identification, 2008. ASID 2008. 2nd International Conference on
Conference_Location :
Guiyang
Print_ISBN :
978-1-4244-2584-6
Electronic_ISBN :
978-1-4244-2585-3
DOI :
10.1109/IWASID.2008.4688351
