Title :
A statistical model to locate faults at input levels
Author :
Ji, Wu ; Xiao-xia, Jia ; Chang, Liu ; Hai-yan, Yang ; Chao, Liu ; Mao-Zhong, Jin
Author_Institution :
Beijing Univ. of Aeronaut. & Astronaut., China
Abstract :
We present a statistical model to locate faults at the input level based on the failure patterns and the success patterns. The model neither needs to be fed with software module, code or trace information, nor does it require re-executing the program. To evaluate the model, precision and recall are adopted as the criteria. Five programs are examined and 17 testing experiments are conducted in which the model gains 0.803 in precision and 0.697 in recall on average.
Keywords :
program testing; program verification; software fault tolerance; statistical analysis; failure patterns; model evaluation; software module; statistical model; success patterns; Chaos; Computer bugs; Debugging; Fault location; Software engineering; Software testing; Visualization;
Conference_Titel :
Automated Software Engineering, 2004. Proceedings. 19th International Conference on
Print_ISBN :
0-7695-2131-2
DOI :
10.1109/ASE.2004.1342745