DocumentCode :
156670
Title :
Will reliability limit Moore´s law?
Author :
Oates, Anthony S.
Author_Institution :
TSMC, Hsinchu, Taiwan
fYear :
2014
fDate :
28-30 April 2014
Firstpage :
1
Lastpage :
1
Abstract :
Summary form only given. Moore´s law continues to the engine of growth for the global electronics industry. The understanding of IC degradation mechanisms has resulted in rapid reliability improvements that have enabled the rapid rate technology progression we have experienced. Going forward it is clear that the reliability margins the industry has enjoyed in the past will shrink. The question is now whether reliability will pose a constraint on Moore´s law. In this talk we will discuss reliability issues that can most directly impact the industry´s capability to maintain the pace of technology progression required by Moore´s law.
Keywords :
integrated circuit reliability; integrated circuit technology; Moore law; global electronics industry; integrated circuit degradation mechanisms; integrated circuit reliability; technology progression;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, Automation and Test (VLSI-DAT), 2014 International Symposium on
Conference_Location :
Hsinchu
Type :
conf
DOI :
10.1109/VLSI-DAT.2014.6834930
Filename :
6834930
Link To Document :
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