• DocumentCode
    156670
  • Title

    Will reliability limit Moore´s law?

  • Author

    Oates, Anthony S.

  • Author_Institution
    TSMC, Hsinchu, Taiwan
  • fYear
    2014
  • fDate
    28-30 April 2014
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Summary form only given. Moore´s law continues to the engine of growth for the global electronics industry. The understanding of IC degradation mechanisms has resulted in rapid reliability improvements that have enabled the rapid rate technology progression we have experienced. Going forward it is clear that the reliability margins the industry has enjoyed in the past will shrink. The question is now whether reliability will pose a constraint on Moore´s law. In this talk we will discuss reliability issues that can most directly impact the industry´s capability to maintain the pace of technology progression required by Moore´s law.
  • Keywords
    integrated circuit reliability; integrated circuit technology; Moore law; global electronics industry; integrated circuit degradation mechanisms; integrated circuit reliability; technology progression;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, Automation and Test (VLSI-DAT), 2014 International Symposium on
  • Conference_Location
    Hsinchu
  • Type

    conf

  • DOI
    10.1109/VLSI-DAT.2014.6834930
  • Filename
    6834930