DocumentCode
156670
Title
Will reliability limit Moore´s law?
Author
Oates, Anthony S.
Author_Institution
TSMC, Hsinchu, Taiwan
fYear
2014
fDate
28-30 April 2014
Firstpage
1
Lastpage
1
Abstract
Summary form only given. Moore´s law continues to the engine of growth for the global electronics industry. The understanding of IC degradation mechanisms has resulted in rapid reliability improvements that have enabled the rapid rate technology progression we have experienced. Going forward it is clear that the reliability margins the industry has enjoyed in the past will shrink. The question is now whether reliability will pose a constraint on Moore´s law. In this talk we will discuss reliability issues that can most directly impact the industry´s capability to maintain the pace of technology progression required by Moore´s law.
Keywords
integrated circuit reliability; integrated circuit technology; Moore law; global electronics industry; integrated circuit degradation mechanisms; integrated circuit reliability; technology progression;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design, Automation and Test (VLSI-DAT), 2014 International Symposium on
Conference_Location
Hsinchu
Type
conf
DOI
10.1109/VLSI-DAT.2014.6834930
Filename
6834930
Link To Document