Title :
Degradation of GMR and TMR recording heads using very short duration ESD transients
Author :
Baril, L. ; Nichols, M. ; Wallash, A.
Author_Institution :
Maxtor Corp., Milpitas, CA, USA
Abstract :
Summary form only given. ESD testing results for GMR and TMR recording heads using a direct charged device model (DCDM) tester are reported for the first time. The DCDM tester produces an extremely fast 600 ps-wide current transient as shown in Fig. 1. The DCDM test is intended to replicate the ESD event produced by charged metal contact to the device input. The DCDM transient is produced by first charging the device itself and then grounding the device with a mercury relay. The ESD testing was done in-situ with a quasistatic (QST) tester. Resistance amplitude, asymmetry and transfer curves were recorded after each ESD event.
Keywords :
digital magnetic recording; electric resistance; electrostatic discharge; giant magnetoresistance; magnetic heads; relays; transfer functions; transients; tunnelling magnetoresistance; 600 ps; DCDM tester; DCDM transient; ESD events; ESD head degradation; GMR recording heads; QST; TMR recording heads; charged device grounding; device charged metal input contact; direct charged device model tester; extremely fast current transients; head output amplitude; head resistance; head transfer curves; in-situ ESD testing; mercury relays; output asymmetry; quasistatic tester; very short duration ESD transients; Degradation; Electrostatic discharge; Geometry; Immune system; Insulation life; Magnetic confinement; Magnetic heads; Magnetic sensors; Testing; Thin film sensors;
Conference_Titel :
Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International
Conference_Location :
Amsterdam, The Netherlands
Print_ISBN :
0-7803-7365-0
DOI :
10.1109/INTMAG.2002.1000948
