• DocumentCode
    1567023
  • Title

    Semi-Supervised Image Classification in Likelihood Space

  • Author

    Duan, Ruchen ; Jiang, Wei ; Man, Hong

  • Author_Institution
    Stevens Inst. of Technol., Hoboken, NJ, USA
  • fYear
    2006
  • Firstpage
    957
  • Lastpage
    960
  • Abstract
    This paper studies the problem of using limited amount of labeled data and large amount of unlabeled data in the training of a generative model for image classification, and proposes a likelihood space approach to improve the classification performance. Frequently when labeled data is limited, unlabeled data can help to improve classification performance if the assumption of the generative model structure in the classifier is correct. But classification accuracy can be degraded if the model structure assumption is incorrect. In this paper, we compare raw data space classification and likelihood space classification in semi-supervised learning framework, and we show that the classification performance can be improved in likelihood space when model is misspecified. We apply this likelihood space semi-supervised learning method in automatic target recognition on SAR images, and experimental results demonstrate the effectiveness of this proposed approach.
  • Keywords
    image classification; learning (artificial intelligence); maximum likelihood estimation; radar imaging; radar target recognition; SAR image; automatic target recognition; data space classification; labeled data; likelihood space classification; semi supervised learning; synthetic aperture radar; unlabeled data; Degradation; Image classification; Image generation; Maximum likelihood estimation; Pattern recognition; Semisupervised learning; Space technology; Target recognition; Training data; Unsupervised learning; Image classification; Pattern recognition; SAR; Target recognition; Unsupervised learning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing, 2006 IEEE International Conference on
  • Conference_Location
    Atlanta, GA
  • ISSN
    1522-4880
  • Print_ISBN
    1-4244-0480-0
  • Type

    conf

  • DOI
    10.1109/ICIP.2006.312634
  • Filename
    4106690